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EWA
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Forschung
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Publikationen
Konferenz- und Jouernalbeiträge
1109/APEC39645.2020.9124178 2019 Unger, C. ; Pfost, M. : Thermal Stability of SiC-MOSFETs at High Temperatures , IEEE Transactions on Electron Devices, 11. 2019, doi: 10.1109/TED.2019.2942011 Oeder, T. ; Pfost [...] Istanbul (Türkei), 08.2019, doi: 10.1109/ACEMP-OPTIM44294.2019.9007121 Oeder, T. ; Pfost, M. : Impact of Carrier Accumulation on the Transient Behavior of p-Gate GaN HEMTs , ISPSD2019 - The 31th International [...] CHN, 05.2019, doi: 10.1109/ISPSD.2019.8757570 Oeder, T. ; Pfost, M. ; D'Aniello, F.; Fayyaz, A.; Castellazzi, A. : Damage Accumulation in GaN GITs Exposed to Repetitive Short-Circuit , ISPSD2019 - The 31th …